Book of abstracts of 6th International Conference on “Electron, Positron, Neutron and X-ray Scattering under External Influences” (21-26 October 2019, Yerevan – Meghri, Armenia), 2019, P. 58,сборник

Статьи, опубликованные в сборнике

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• • 2019 Improving the reliability of identification of single crystals structure defects
  • Tkal V.A., Bushuev V.A.
  • в сборнике Book of abstracts of 6th International Conference on “Electron, Positron, Neutron and X-ray Scattering under External Influences” (21-26 October 2019, Yerevan – Meghri, Armenia), 2019, P. 58,, место издания Institute of Applied Problems of Physics, NAS Republic of Armenia Yerevan, тезисы, с. 58-58