ИСТИНА |
Войти в систему Регистрация |
|
ИПМех РАН |
||
Phase-contrast X-ray imaging is a powerful tool with various applications. One of the most promising imaging techniques, X-ray Talbot interferometry, still requires modern x-ray focusing optics, with small focal distance and focal spot size for better resolution. This work investigates the development of two types of optical elements suitable for hard x-ray microscopy: compound refractive lenses for hard x-ray microscopy and interferometers for hard x-ray phase contrast microscopy.