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High-temperature growth and comparative characterization of (Er,Yb):YAl3(BO3)4 and NdAl3(BO3)4 epitaxial layersдоклад на конференции
- Авторы: Maltsev V.V., Leonyuk N.I., Kolganova O.V., Volkova E.A.
- Международная Конференция : The 17th Intern. Conf. on Crystal Growth and Epitaxy (ICCGE-17)
- Даты проведения конференции: 2013
- Тип доклада: Устный
- Докладчик: Volkova E.A.
- Место проведения: Warsaw, Poland, Poland
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Аннотация доклада:
Er0.04Y0.96Al3(BO3)4, Er0.015Yb0.11Y0.875Al3(BO3)4 and NdAl3(BO3)4 epitaxial layers were grown from K2Mo3O10-based fluxed melts by LPE method. DSSG-grown YAB and NAB single crystals were used as substrates. Growth kinetics, homogeneity and micromorphology of (Er,Yb):YAB and NAB thin films were investigated.
- Добавил в систему: Леонюк Николай Иванович