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Surface Investigation X-Ray, Synchrotron and Neutron Techniquesжурнал

Статьи, опубликованные в журнале

• 
  • 1998 ON THE POSSIBILITY OF ANALYSIS OF FRACTAL ARSENIC CLUSTERS IN SILICON BY THE CHANNELING METHOD
  • Pokhil G.P., Popov V.P., Tulinov A.F., Zatekin V.V.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 13, № 8, с. 1003-1007
• 
  • 1998 STUDY OF HIGH DOSE IMPLANTATION OF NITROGEN INTO GRAPHITE
  • Romanovsky E.A., Bespalova O.V., Borisov A.M., Goryaga N.G., Zatekin V.V., Kulikauskas V.S., Sukharev V.G.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 13, № 8, с. 1053-1058
• • 1998 Spatial distributions of the particles sputtered under ion bombardment. II. Computer simulation and experimental results
  • Mashkova E.S., Molchanov V.A.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 13, с. 1541-1560
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  • 1998 Z1 -Oscillation in the Electronic Interaction Cross-Section and Stopping Power of Heavy Ions Slowly Moving Through Gases
  • Gelfort S., Kerkov H., Stolle R., Petukhov V.P., Pomanovskiy E.A.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 13, с. 663-669
• 
  • 1997 Modification of Near-Surface Silicon Layers under Cesium Ion Bombardment
  • Mashkova E.S., Molchanov V.A., Shul'ga Benazeth C., Banazeth N., Cafarelli P., Hou M., Eckstein W.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 12, с. 973-987
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  • 1997 Modification of near-surface silicon layers under cesium ion bombardment
  • Mashkova E.S., Molchanov V.A., Shulga V.I., Benazeth C., Benazeth N., Cafarelli P., Hou M., Eckstein W.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 12, с. 973-987
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  • 1997 OSCILLATING AND BIFURCATING STRUCTURAL CHANGES IN SOLID SYSTEMS CONTAINING HYDROGEN AND OXYGEN
  • Katsnelson A.A., Avdyukhina V.M., Kolesova N.S., Revkevich G.P.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 12, № 7, с. 835-844
• • 1997 Осциллирующие и бифуркационные структурные изменения в водород и кислородсодержащих твердотельных системах
  • Avdjukhina V.M., Katsnelson A.A., Kodess B.N., Kolesova N.S., Revkevich G.P., Zhivotov S.M.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, том 12, с. 62-70
• • 1994 Computer simulation of sputtering of (111) face of crystalline Si thin film
  • Eltekov V.A., Yurasova V.E., Negrebetskaya N.N., Vasichkina N.G.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, № 2, с. 46-54
• • 1986 Investigation of the surface by means of total external reflection of radiation in X-ray region
  • Andreeva M.A., Borisova S.F., Stepanov S.A.
  • в журнале Surface Investigation X-Ray, Synchrotron and Neutron Techniques, № 4, с. 951-969