Microelectronic Engineeringжурнал

Статьи, опубликованные в журнале

---

• 
  • 2018 A non-destructive, fast evaluation of PVD diffusion barriers deposited on porous low-k dielectrics
  • Yingjie Wang, Peng He, Jing Zhang, Jiang Yan, Lopaev D.V., Xin-Ping Qu, Baklanov M.R.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 198, с. 22 DOI
• 
  • 2013 Multi-electrode monitoring of guided excitation in patterned cardiomyocytes
  • Wang L., Liu L., Li X., Magome N., Agladze K., Chen Y.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 111, с. 267-271 DOI
• 
  • 2013 Multi-electrode monitoring of guided excitation in patterned cardiomyocytes
  • Wang L., Liu L., Li X., Magome N., Agladze K., Chen Y.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 111, с. 267-271
• 
  • 2012 Optical generation of free charge carriers in nanocrystalline tin oxide for gas sensor application
  • Zhurbina I.А., Timoshenko V.Yu
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 90, с. 44-46
• 
  • 2012 Optical properties of materials based on oxidized porous silicon and their applications for UV protection
  • Pavlikov Alexander V., Lartsev Arseniy V., Gayduchenko Igor A., Timoshenko Victor Yu
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 90, № 0, с. 96-98 DOI
• 
  • 2009 Effect of high-temperature annealing on lanthanum aluminate thin films grown by ALD on Si(100)
  • Congedo G., Spiga S., Lamagna L., Lamperti A., Lebedinskii Yu, Matveyev Yu, Zenkevich A., Chernykh P., Fanciullia M.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 86, № 7-9, с. 1696-1699
• 
  • 2005 Magnetic resonance properties of La(0.8)Sr(0.2)MnO(3) small particles
  • Koksharov Y.A., Nikiforov V.N., Kumetsov V.D., Khomutov G.B.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 81, № 2-4, с. 371-377 DOI
• 
  • 2005 Monomolecular polymeric films with incorporated Au-101 clusters
  • Soldatov E.S., Kislov V.V., Gubin S.P., Artemyev M., Kisiel D., Sergeev-Cherenkov A.N., Pavlov S.A., Trifonov A.S., Khomutov G.B.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 81, № 2-4, с. 400-404 DOI
• 
  • 2005 Optical activity in chiral gold nanogratings
  • Jefimovs K., Saito N., Ino Y., Vallius T., Vahimaa P., Turunen J., Shimano R., Kauranen M., Svirko Y., Kuwata-Gonokami M.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 78, с. 448-451 DOI
• 
  • 2005 The peculiarities of single-electron transport in granular Cr films
  • Krupenin V.A., Zalunin V.O., Zorin A.B.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 81, № 2-4, с. 217-221 DOI
• 
  • 2005 Ultra-soft magnetic films: micromagnetism and high frequency properties
  • Chechenin N.G.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 81, № 2-4, с. 303-309 DOI
• 
  • 2003 Defect-deformational self-organization and nanostructuring of solid surfaces
  • Emel'yanov V.I.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 2-4
• 
  • 2003 In situ plasma diagnostics for chemical vapor deposition of nano-carbon thin film materials
  • Obraztsov A.N., Zolotukhin A.A., Ustinov A.O., Volkov A.P., Svirko Y., Jefimovs K.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 446-451 DOI
• 
  • 2003 Interfacial nanofabrication strategies in development of new functional nanomaterials and planar supramolecular nanostructures for nanoelectronics and nanotechnology
  • Khomutov G.B., Kislov V.V., Antipina M.N., Gainutdinov R.V., Gubin S.P., Obydenov A.Y., Pavlov S.A., Rakhnyanskaya A.A., Sergeev-Cherenkov A.N., Soldatov E.S., Suyatin D.B., Tolstikhina A.L., Trifonov A.S., Yurova T.V.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 373-383 DOI
• 
  • 2003 Magnetic and magnetooptical properties of nanoheterostructures containing FeNi and SiC layers
  • Buravtsova V.E., Gan'shina E.A., Guschin V.S., Kasatkin S.I., Muravyev A.M., Pudonin F.A.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 279-282 DOI
• 
  • 2003 Metrological measurements and signal processing in SEM based on the model of signal formation
  • Chulichkov A.I., Grachev E.A., Ustinin D.M., Cheremukhin E.A.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 555-564
• 
  • 2003 Molecular cluster based nanoelectronics
  • Soldatov E.S., Gubin S.P., Maximov I.A., Khomutov G.B., Kolesov V.V., Sergeev-Cherenkov A.N., Shorokhov V.V., Sulaimankulov K.S., Suyatin D.B.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2, с. 536-548
• 
  • 2003 Nano-carbon materials for cold cathode applications
  • Obraztsov A.N., Zakhidov A.A., Volkov A.P., Lyashenko D.A.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 405-411 DOI
• 
  • 2003 Poly(acrylamide) gels with embedded magnetite nanoparticles
  • Starodoubtsev S.G., Saenko E.V., Khokhlov A.R., Volkov V.V., Dembo K.A., Klechkovskaya V.V., Shtykova E.V., Zanaveskina I.S.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 324-329 DOI
• 
  • 2003 Selective removal of atoms as a new method for fabrication of nanoscale patterned media
  • Gurovich B.A., Dolgy D.I., Kuleshova E.A., Meilikhov E.Z., Domantovsky A.G., Prikhodko K.E., Maslakov K.I., Aronzon B.A., Rylkov V.V., Yakubovsky A.Y.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 69, № 2-4, с. 358-364 DOI
• 
  • 2001 Comprehensive simulation of electron-beam lithography processes using PROLITH/3D and TEMPTATION software tools
  • Sergey Babin, Kuzmin Igor Yu, Mack Chris A.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 57, с. 343-348
• 
  • 2001 Defect transformation under growth of submonolayer oxides on silicon surfaces at low temperatures
  • Dittrich T., Bitzer T., Rada T., Richardson N.V., Timoshenko V.Y., Rappich J., Koch F.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 59, № 1-4, с. 399-404 DOI
• 
  • 2001 Four-angle evaporation method for the preparation of single electron tunneling devices
  • Weimann T., Scherer H., Krupenin V.A., et al.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 57, № 8, с. 915 DOI
• 
  • 1999 Effect of local surface structure on electronic properties of hydrogenated silicon surfaces
  • Dittrich T., Timoshenko V.Y., Schwartzkopff M., Hartmann E., Rappich J., Kashkarov P.K., Koch F.
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 48, № 1-4, с. 75-78 DOI
• 
  • 1999 Simulation and measurement of resist heating in multipass exposure using a 50 kV variably shaped beam system
  • Babin S., Hartmann H., Kuzmin I.Yu
  • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 46, № 1-4, с. 231-234