On the design of switching circuits admitting small detection test setsстатья
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Дата последнего поиска статьи во внешних источниках: 18 марта 2016 г.
Аннотация:It is established that, for an arbitrary nonconstant Boolean function f(x_1, ..., x_n), there exist the following testable switching circuits that admit a single fault detection test set of cardinality O(n): (a) a three-pole switching circuit (with one input and two output poles) that
realizes a system of functions (f, f⊕1) and
(b) a two-pole switching circuit that realizes a function f(x_1, ..., x_n) ⊕ x_{n+1}.
It is also proved that almost all Boolean functions f(x_1, ..., x_n) can be realized by two-pole switching circuits that admit small detection test sets (test sets of cardinality O(n)) under homogeneous faults of switches (closures or breakings).