Synergy between transmission electron microscopy and powder diffraction: application to modulated structuresстатья
Информация о цитировании статьи получена из
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Дата последнего поиска статьи во внешних источниках: 5 декабря 2015 г.
Аннотация:The crystal structure solution of modulated compounds is often very
challenging, even using the well established methodology of single-crystal Xray
crystallography. This task becomes even more difficult for materials that
cannot be prepared in a single-crystal form, so that only polycrystalline powders
are available. This paper illustrates that the combined application of
transmission electron microscopy (TEM) and powder diffraction is a possible
solution to the problem. Using examples of anion-deficient perovskites
modulated by periodic crystallographic shear planes, it is demonstrated what
kind of local structural information can be obtained using various TEM
techniques and how this information can be implemented in the crystal structure
refinement against the powder diffraction data. The following TEMmethods are
discussed: electron diffraction (selected area electron diffraction, precession
electron diffraction), imaging (conventional high-resolution TEM imaging, highangle
annular dark-field and annular bright-field scanning transmission electron
microscopy) and state-of-the-art spectroscopic techniques (atomic resolution
mapping using energy-dispersive X-ray analysis and electron energy loss
spectroscopy).