Analysis of the melting temperatures of RTX2 (CeNiSi2 structure) and RT2X2 (CeGa2Al2 structure) compounds [R=La,Ce,Sm,Er,Tm; T=Fe, Co,Ni; X=Si,Geстатья
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Аннотация:1998
AB Physico-chemical analysis techniques, including X-ray phase analysis and
differential thermal analysis were employed for the characterisation of
compounds including their melting temperature. The melting temperature
of 23 RT3X2 compounds belonging to the CeGa2Al2 structure has been
measured. The melting temperature of 19 RTX2 compounds belonging to the
CeNiSi2 structure has been measured (LaCoSi2, LaNiSi2, CeFeSi2, CeCoSi2,
CeNiSi2, SmCoSi2, SmNiSi2, ErCoSi2, ErNiSi2, TmCoSi2, TmNiSi2, LaCoGe2,
LaNiGe2, CeFeGe2, CeCoGe2, CeNiGe2, SmFeGe2, SmCoGe2, SmNiGe2). It is
established, that the new ternary compound SmCoSi2 belongs the CeNiSi2
structure type (group Cmcm, a=0.4088(1) nm, b=1.6320(3) nm, c=0.4008(1)
nm).