Extreme Scattering Effect: Light scattering analysis via the Discrete Sources Methodстатья
Статья опубликована в высокорейтинговом журнале
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:The effect of the Extraordinary Optical Transmission (Ebbesen et al. Nature 1998; 391, 667) through subwavelength holes array in noble metal screen is used for multiple practical applications in nanooptics and biophotonics. In this paper the Extreme Transmission Effect (Eremina et al. Opt. Comm. 2008; 281, 3581) in the noble metal film deposited on a glass prism in the evanescent wave’s area is in focus. The Discrete Sources Method (DSM) has been adjusted to calculate the polarized light scattering by an axially symmetric inclusion located in a film deposited on a glass prism. We extended the DSM for the evaluation of the Scattering Cross-Section in the prism domain. It has been shown that the maximum value of the Reflection Cross-Section appears at the same incident angle as for the Transmission Cross-Section. It has been demonstrated that the Reflection Cross-Section can exceed the Transmission Cross-Section under certain circumstances. Analysis of the correlation between the Plasmon Resonance in the gold film and the Extreme Scattering Effect demonstrates that the Plasmon Resonance plays an important but not the exclusive role in the appearance of the Extreme Scattering Effect.