Infrared and submillimeter spectroscopy of grooved silicon structuresстатья
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Transmission of grooved silicon structures with 4-and 7-mu m periods is studied by polarization-sensitive IR and submillimeter spectroscopy in a wide spectral range. The experimental results obtained in the range 1-10-mu m are explained in terms of geometrical optics taking into account the scattering of radiation. In the far-IR (20-2000 mu m) range, the structures exhibit a strong birefringence, which can be described in terms of the effective medium model in the electrostatic approximation. An influence of photoexcitation on the optical transmission and its anisotropy is observed; this effect can be explained in terms of the effective medium model taking into account the interaction of radiation with free carriers.