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Measurement of thermal properties of thin dielectric films and anisotropic solids by AC hot-strip methodстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
- Авторы: Davitadze S.T., Kravchun S.N., Mizina N.S., Strukov B.A., Goltsman B.M., Lemanov V.V., Shulman S.G.
- Журнал: Ferroelectrics
- Том: 208
- Номер: 1-4
- Год издания: 1998
- Издательство: Taylor and Francis
- Местоположение издательства: United States
- Первая страница: 279
- Последняя страница: 292
- Аннотация: The present work deals with the foundations of the theory of the method of measuring the thermal properties of anisotropic solids and thin dielectric films deposited onto them. The experimental setup is briefly described. The authors demonstrate the possibility of measuring a set of thermal properties of solids by means of recording the amplitude and phase of temperature oscillations of a strip, which has a width comparable with the attenuation length of a temperature wave in the sample. The paper offers the results of measurements of the heat capacity, thermal conductivity, thermal diffusivity and thermal activity of leucosapphire. The thermal conductivity of an SrTiO3 him about 2 mu m thick sputtered onto a single crystal of leucosapphire was determined by measuring the temperature oscillation amplitude at various frequencies.
- Добавил в систему: Струков Борис Анатольевич