Аннотация:Depth-sensitive magnetic, structural, and chemical characterization is important in the understanding and
optimization of physical phenomena emerging at the interfaces of transition metal oxide heterostructures. In a
simultaneous approach we have used polarized neutron and resonant x-ray reflectometry to determine themagnetic
profile across atomically sharp interfaces of ferromagnetic La0.67Sr0.33MnO3/multiferroic BiFeO3 bilayers with
subnanometer resolution. In particular, the x-ray resonant magnetic reflectivity measurements at the Fe and Mn
resonance edges allowed us to determine the element-specific depth profile of the ferromagnetic moments in
both the La0.67Sr0.33MnO3 and BiFeO3 layers. Our measurements indicate a magnetically diluted interface layer
within the La0.67Sr0.33MnO3 layer, in contrast to previous observations on inversely deposited layers [P. Yu et al.,
Phys. Rev. Lett. 105, 027201 (2010)]. Additional resonant x-ray reflection measurements indicate a region of
altered Mn and O content at the interface, with a thickness matching that of the magnetic diluted layer, as the
origin of the reduction of the magnetic moment.