The composition analysis of YBa2Cu3O7-delta or PrBa2Cu3O7-delta thin films and (YBa2Cu3O7-delta/PrBa2Cu3O7-delta)(n) heterostructures prepared by CVDстатья
Информация о цитировании статьи получена из
Scopus,
Web of Science
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:Some YBa2Cu3O7-delta films and heterostructures prepared by Chemical Vapor Deposition (CVD) were analyzed in our laboratories by EPMA-EDX or WDX, RES, SNMS and AES. It was found that in some cases the results of composition analysis can significantly deviate from each other. At least two main reasons for these deviations exist: the different lateral resolution and the application of different reference samples for the calibration.