|
ИСТИНА |
Войти в систему Регистрация |
ИПМех РАН |
||
Electrodeposited oxotungstate films: Towards the molecular nature of recharging processesстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
- Авторы: Laurinavichute Veronika K., Sergey Yu Vassiliev, Khokhlov Alexander A., Plyasova Lyudmila M., Molina Irina Yu, Tsirlina Galina A.
- Журнал: Electrochimica Acta
- Том: 56
- Номер: 10
- Год издания: 2011
- Издательство: Elsevier BV
- Местоположение издательства: Netherlands
- Первая страница: 3530
- Последняя страница: 3536
- DOI: 10.1016/j.electacta.2010.10.077
- Аннотация: In situ Raman spectroscopy is applied to supplement voltammetric, spectroelectrochemical, and XRD data on redox transformations of electrodeposited oxotungstate films. These films undergo electrochromic transition at rather positive potentials, as compared to usual sputtered tungsten oxides. The depth of electroreduction for the films conditioned in acidic solutions under open circuit is about 0.11 eв€’ per W atom. Coloration of the films correlates with the decrease of Raman band, corresponding to the terminal W(VI)O vibration in the hydrated phase of highly defective tungstic acid (hydrated tungsten oxide). Our data allow to state the absence of oxotungstate octahedra rearrangement in the course of reduction at positive RHE potentials, and to assume that slightly deeper reduction up to 0.15 W(V)/[W(V) + W(VI)] ratio is possible at more negative potentials. We also demonstrate that the gas phase reduction is less reversible as compared to electrochemical reduction in solution. The most possible nature of films degradation in the gas phase is their partial dehydration in the course of reduction.
- Добавил в систему: Лауринавичюте Вероника Кестучё