Critical current density of high quality YBa2Cu3O7 thin films determined from AC magnetic susceptibility: VOL 1: PLENARY TALKS AND HIGH CURRENT APPLICATIONS; VOL 2: SMALL SCALE APPLICATIONSстатья
Информация о цитировании статьи получена из
Web of Science
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 27 мая 2015 г.
Аннотация:In the following paper, we present a non-destructive method to determine the temperature dependence of the critical current densities from standard AC susceptibility measurements. This method, which is based on the critical state model, is applied to high quality YBa2Cu3O7-delta thin films with very high critical current densities (4-8x10(6)A/cm(2) at 77K). The obtained results are compared to the determination of J(c) by a standard four contact method. A good agreement between these two methods has been found from T-c to 77K.