Plasmon-Enhanced Near-Field Optical Spectroscopy of Multicomponent Semiconductor Nanostructuresстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 28 февраля 2020 г.
Аннотация:—Multicomponent semiconductor nanostructures were studied by local spectral analysis
based on surface-enhanced Raman scattering by semiconductor nanostructures located on the surface of an array of Au nanoclusters near the metallized tip of an atomic force microscope. In the gap
between the metal nanoclusters and the tip, where a semiconductor nanostructure is located, there is a
strong increase in the local electric field (hot spot), resulting in a dramatic enhancement of the Raman
scattering signal. An unprecedented enhancement of the Raman scattering signal by two-dimensional
(over 108
for MoS2) and zero-dimensional (106
for CdSe nanocrystals) semiconductor nanostructures
was achieved. The use of the method for mapping the Raman scattering response of a multicomponent system of MoS2 and CdSe made it possible to identify components with a spatial resolution far
exceeding the diffraction limit.