Electron and hole traps created by X-ray irradiation in Li2MoO4 cryogenic scintillator

Авторы: Buryi M., Laguta V., Babin V., Spassky D.A., Shlegel V.N., Nagirnyi V.
Журнал: Optical Materials
Том: 114
Год издания: 2021
Издательство: Elsevier BV
Местоположение издательства: Netherlands
Номер статьи: 110971
DOI: 10.1016/j.optmat.2021.110971
Аннотация: The origin and thermal stability of charge trapping centers were studied in Li2MoO4 cryogenic scintillators by correlated electron paramagnetic resonance (EPR) and thermally stimulated luminescence (TSL) measurements. Up to five electron and three hole trapping centers were detected in the crystals X-ray irradiated at 77 K. The electron traps were ascribed to MoO43- molecular complexes, unperturbed and perturbed by neighboring defects, while the hole traps – to O- lattice ions perturbed by lithium and molybdenum vacancies. The thermal stability of the trapping centers was studied and the depths of electron and hole traps were determined. The TSL peaks observed in the 77-300 K temperature range were related to the depletion of the detected paramagnetic centers. Influence of the revealed centers on the scintillation light yield is discussed.
Добавил в систему: Спасский Дмитрий Андреевич

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