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Linear optical circuits characterization by means of thermal field correlation measurementстатья
- Авторы: Katamadze K.G., Avosopiants G.V., Romanova A.V., Bogdanov Yu I., Kulik S.P.
- Журнал: Laser Physics Letters
- Том: 18
- Номер: 7
- Год издания: 2021
- Издательство: Wiley - VCH Verlag GmbH & CO. KGaA
- Местоположение издательства: Germany
- DOI: 10.1088/1612-202X/abfc43
- Аннотация: We present a novel technique for linear optical circuits characterization, based on thermal field correlation measurements. Unlike the other known methods for multichannel interferometers measurements, proposed technique is robust to the input and output phase fluctuations and does not require any single-photon sources and detectors. This method has been tested in a numerical experiment and has proven to be effective even in the presence of noise.
- Добавил в систему: Кулик Сергей Павлович