X-Ray Reflectometry for Comparison of Structural Organization of Fullerenes C60/C70 in Polystyrene Thin Filmsстатья
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Дата последнего поиска статьи во внешних источниках: 15 декабря 2021 г.
Аннотация:Thin films of polystyrene–fullerene C60/C70 nanocomposites were prepared by spin-coating the corresponding toluene solutions. The structural organization of the nanoparticles in the polymer matrix was investigated by X-ray reflectometry. For both fullerene molecules, the layer on the substrate was detected by model fitting of the reflectivity curves. We obtain that the thickness of this layer was similar for C70 and for C60 at the same concentrations of the initial solution.