Characterization of Crystalline Carbon Nitrides for Thin Films and Bulk Samplesстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:In this research, a new method was developed for the preparation of bulk samples of crystalline carbon nitride(CCN) on exposure of an amorphous nitrogen- and carbon-containing material to high temperature and ultrahigh pressure in the presence of crystallization seeds. Amorphous carbon nitride whose composition was close to C(3)N(4) was used as a starting material. Thin films of CCNs prepared by using the laser-electric discharge method were used as crystallization seeds. The samples were evaluated by using X-ray photoelectron spectroscopy, infrared spectroscopy, Auger electron spectroscopy, secondary-ion mass spectrometry, scanning electron microscopy, X-ray diffraction, and selected-area transmission electron diffraction.