Single-crystal diamond probes for atomic-force microscopyстатья
Информация о цитировании статьи получена из
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:The results of investigations aimed at the development and testing of diamond probes for scanning atomic-force microscopy are presented. Plasmochemical deposition of diamond polycrystalline films and selective thermal oxidation were used to manufacture diamond probes. The obtained single-crystal diamond pyramidal tips of micron size had a radius of curvature of 2-20 nm at the top. The diamond tips were attached to a cantilever with an epoxy adhesive and then tested as probes in scanning atomic-force microscopy. Tests have shown that the manufactured diamond probes have appreciable advantages over conventional probes.