|
ИСТИНА |
Войти в систему Регистрация |
ИПМех РАН |
||
Processing and Recognition of Two-Coordinate Reference Images in Scanning Probe Microscopyстатья
- Авторы: Гуляев П.В., Тюриков А.В., Ермолин К.С., Шелковникова Т.Е.
- Журнал: Optics and Spectroscopy (English translation of Optika i Spektroskopiya)
- Том: 130
- Номер: 11
- Год издания: 2022
- Издательство: Optical Society of America
- Местоположение издательства: United States
- DOI: 10.1134/S0030400X22110029
- Аннотация: The article is devoted to the problem of automatic positioning of a scanning probe microscope toa studied region after probe replacement, sample surface treatment, etc. As an auxiliary tool for positioning,it is proposed to use reference marks indicating directions of the probe displacement to the investigatedregion. The considered pattern of reference marks is a cross. A method of detection of reference marks in theimage by analyzing the surface curvature is described. An algorithm of recognition of reference marks basedon the structural analysis of positions of singular points (local extrema of curvature) is proposed. Analysis isperformed for selected pairs of singular points with specific length and angle of inclination. For selected pairs,parallel transfer parameters are calculated. If reference marks are present in the frame, these parameters areordered along a straight line, which is a qualitative criterion of recognition of reference marks.
- Добавил в систему: Гуляев Павел Валентинович