Аннотация:A new technological method based on low-energy ion implantation to create porous PSi and PGe layers on the crystalline surface of semiconductor wafers is presented in this study. It is also demonstrated that various PSi and PGe structures with nanoparticles AgNPs may be successfully produced using a high-dose (more than 1.0 1016 ion/cm2) Ag-ion implantation of Si and Ge with the energy of 30 keV.