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Evaluation of laser-electron x-ray source and related optics for x-ray diffractometry and topographyстатья
Информация о цитировании статьи получена из
Scopus
Дата последнего поиска статьи во внешних источниках: 15 февраля 2024 г.
- Авторы: Polyakov S.N., Artyukov I.A., Blank V.D., Zholudev S.I., Feshchenko R.M., Popov N.L., Yaroslavtsev A.A., Vinogradov A.V.
- Сборник: X-ray Lasers and Coherent X-ray Sources: Development and Applications
- Том: 10243
- Год издания: 2017
- Место издания: SPIE
- Первая страница: 102430Y
- DOI: 10.1117/12.2264976
- Аннотация: A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.
- Добавил в систему: Артюков Игорь Анатольевич