X-ray investigations of epitaxial Bi2Sr2CaCu2O8+x thin films grown on SrTiO3 substrates with MgO and CeO2 buffer layers for the fabrication of biepitaxial Josephson junctions

Polyakov, S.N.; Kovev, E.K.; Kupriyanov, M.Y.; Pfuch, A.; Wiese, A.; Seidel, P.

Информация о цитировании статьи получена из Scopus, Web of Science
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.

Авторы: Polyakov S.N., Kovev E.K., Kupriyanov M.Y., Pfuch A., Wiese A., Seidel P.
Журнал: Superconductor Science and Technology
Том: 9
Номер: 2
Год издания: 1996
Издательство: IOP Publishing
Местоположение издательства: [Bristol, UK], England
Первая страница: 99
Последняя страница: 103
DOI: 10.1088/0953-2048/9/2/006
Аннотация: X-ray diffraction methods have been used for investigation of epitaxial Bi2Sr2CaCu2O8+x (BSCCO-2212) thin films grown by laser ablation on SrTiO3 substrates buffered with MgO and CeO2. The analysis showed that the films are nearly single crystalline. The deposition of a CeO2 buffer layer improves the microstructure of the BSCCO-2212 film and leads to a light orthorhombic lattice distortion. For the film grown on a CeO2/MgO (less than or equal to 10 nm) buffer layer system we observed 0 degrees and 45 degrees oriented domains. Using an original method, the lattice parameters a and b were measured. It was found that the critical current j(c) is closely correlated with the structural quality of the films. First experiments were carried out to prepare biepitaxial Josephson junctions based on BSCCO-2212 material.
Добавил в систему: Куприянов Михаил Юрьевич

	ИСТИНА	Войти в систему Регистрация
	ИПМех РАН
	Главная Поиск Статистика О проекте Помощь

ИСТИНА

ИПМех РАН

X-ray investigations of epitaxial Bi2Sr2CaCu2O8+x thin films grown on SrTiO3 substrates with MgO and CeO2 buffer layers for the fabrication of biepitaxial Josephson junctionsстатья

Прикрепленные файлы