High-temperature growth and comparative characterization of (Er,Yb):YAl3(BO3)4 and NdAl3(BO3)4 epitaxial layersстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 31 октября 2014 г.
Аннотация:Er0.04Y0.96Al3(BO3)4, Er0.015Yb0.11Y0.875Al3(BO3)4 and NdAl3(BO3)4 epitaxial layers were grown from
K2Mo3O10-based fluxed melts by an LPE method. SGDS grown YAl3(BO3)4 and NdAl3(BO3)4 single crystals
were used as substrates. Growth kinetics, homogeneity and micromorphology of Er:YAl3(BO3)4,
(Er,Yb): YAl3(BO3)4 and NdAl3(BO3)4 thin films were investigated.
&