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High Resolution Capabilities of All-Silica Cantilevered Probes for Near-Field Optical Microscopyстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 31 октября 2014 г.
- Авторы: Descrovi E., Aeschimann L., Soboleva I., De Angelis F., Giorgis F., Di Fabrizio E.
- Журнал: Journal of Nanoscience and Nanotechnology
- Том: 9
- Год издания: 2009
- Издательство: American Scientific Publishers
- Местоположение издательства: United States
- Первая страница: 6460
- Аннотация: We report on the possibility of performing Near-field Scanning Optical Microscopy in illumination mode by means of microfabricated, metal-coated silica probes based on transparent cantilevers. A low spring constant silica cantilever hosts a silica tip at its end showing an hyperbolic profile and a circular symmetry. After evaporation of 100 nm of aluminium on the tip and the cantilever we processed the tip apex by means of a FIB, thus obtaining either a probe apex with an optical aperture or an apertureless probe having a thin metal layer on the top. An excellent quality of near-field images of samples showing sub-wavelength features is obtained in both case. In particular, the apertureless probe allows highly resolved topographical and optical images to be collected at the same time. This work further demonstrates that the use of completely transparent, metal-coated cantilevers greatly simplify the light injection into the probe and the fabrication process consequently.
- Добавил в систему: Соболева Ирина Владимировна