Feature-oriented scanning probe microscopy

Автор: Lapshin R.V.
Год издания: 2011
Издательство: American Scientific Publishers
Местоположение издательства: United States
Объём: 11 страниц
ISBN: 1-58883-159-0
Академическое издание
Аннотация: Feature-oriented scanning probe microscopy (FOSPM) is a set of probe methods intended for surface investigation with high spatial resolution. FOSPM allows direct operations with surface features (objects), which linear dimensions range from tens of nanometers to several angstroms. Operations with features include measurements of topography and surface properties as well as active surface modification. Capabilities of the method related to an active influence on surface features allow us to consider FOSPM as a basis for implementation of “bottom-up” nanofabrication. In that case, the scanning probe microscope (SPM) will serve as a prototype of a nanoassembler. Operating in the completely autonomous mode, FOSPM can provide high precision of measurements, stimulations, and manipulations at room temperature. Specialized probes that form a set of various measuring and technological tools may be used consistently in FOSPM. FOSPM is based on the following methods: feature-oriented scanning (FOS), counter-scanning (CS), distributed calibration, and feature-oriented positioning (FOP).
Добавил в систему: Лапшин Ростислав Владимирович

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