ИСТИНА

Scherer H.

Соавторы: Niemeyer J., Зорин А.Б., Weimann T., Крупенин В.А., Lotkhov S.V., Wolf H., Преснов Д.Е., Ahlers F.J., Dolata R., Hinze P., Pashkin Y.A., Pavolotski A.B., Samwer B.W. показать полностью..., Savvateev M.N., Zangerle H., Ahlers F.J., Angelstam P., Antrop M., Augstburger H., Bauer E., Blum W., Dannowski R., Eulenstein F., G-D W., Garibaldi L., Giester G., Gómez Carella D.S., Hennings V., Hilscher G., Jones M.E., Jörg H., Klanner R., Lothar M., Manton M., McKenze B., Michor H., Mirschel W., Pachikin K., Rogl P., Saparov A., Schwilch G., Sheudshen A.K., Sychev V.G., Uwe S., Грибанов А.В., Дронин Н.М., Лукин С.М., Романенков В.А., Рухович О.В., Сальников Е.Д., Серопегин Ю.Д., Турсина А.И.

25 статей, 3 тезисов докладов

Количество цитирований статей в журналах по данным Web of Science: 272, Scopus: 262

IstinaResearcherID (IRID): 544429

Деятельность

• Статьи в журналах

  • 
    • 2006 Crystal chemistry and low-temperature properties of Yb18Pt51.1Si15.1 (approximate to YbPt3Si)
    • Bauer E., Lackner R., Hilscher G., Michor H., Scheidt E.W., Scherer W., Rogl P., Gribanov A., Tursina A., Seropegin Y., Giester G.
    • в журнале Physical Review B, издательство American Physical Society (United States), том 73, № 10, с. 104405-1 -104405-7 DOI
  • 
    • 2005 Single-charge devices with ultrasmall Nb/AlOx/Nb trilayer Josephson junctions
    • Dolata R., Scherer H., Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 97, № 5, с. 054501-1-054501-8 DOI
  • 
    • 2005 Steps towards a capacitance standard based on single-electron counting at PTB
    • Scherer H., Lotkhov S.V., G-D Willenberg, Zorin A.B.
    • в журнале IEEE Transactions on Instrumentation and Measurement, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 54, с. 666-669
  • 
    • 2003 Single electron transistors with Nb/AlOx/Nb junctions
    • Dolata R., Scherer H., Zorin A.B., Niemeyer J.
    • в журнале Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, издательство AIP Publishing (United States), том 21, с. 775-780
  • 
    • 2002 Single electron transistors with high quality superconducting niobium islands
    • Dolata R., Scherer H., Zorin A.B., Niemeyer J.
    • в журнале Applied Physics Letters, издательство AIP Publishing (United States), том 80, № 15, с. 2776-2778 DOI
  • 
    • 2001 Four-angle evaporation method for the preparation of single electron tunneling devices
    • Weimann T., Scherer H., Krupenin V.A., et al.
    • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 57, № 8, с. 915 DOI
  • 
    • 2001 The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors
    • Scherer H., Weimann Th, Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 90, № 5, с. 2528-2532
  • 
    • 2000 All-chromium single electron tunneling devices fabricated by direct-writing multilayer technique
    • Scherer H., Hinze P., Weimann Th, Samwer B.W., Zorin A.B., Niemeyer J.
    • в журнале Physica B: Condensed Matter, издательство Elsevier BV (Netherlands), том 284, с. 1806-1807
  • 
    • 1999 A Superconducting Electrometer Based on the Resitively Shunted Bloch Transistor
    • Lotkhov S.V., Zangerle H., Zorin A.B., Weimann Th, Scherer H., Niemeyer J.
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 9, с. 3664-3667
  • 
    • 1999 Characterization of All-chromium Tunnel Junctions and Single-electron Tunneling Devices Fabricated by Direct-writing Multilayer Technique
    • Scherer H., Weimann Th, Hinze P., Samwer B.W., Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 86, № 12, с. 6956-6964
  • 
    • 1999 Charging and heating effects in a system of coupled single-electron devices
    • Krupenin V.A., Lotkhov S.V., Scherer H., Zorin A.B., Weimann Th, Ahlers F.J., Niemeyer J., Wolf H.
    • в журнале Physical Review B, издательство American Physical Society (United States), том 59, № 16, с. 10778-10784 DOI
  • 
    • 1999 Highly sensitive electrometers based on single Cooper pair tunneling
    • Zorin A.B., Lotkhov S.V., Pashkin Yu A., Zangerle H., Krupenin V.A., Weimann Th, Scherer H., Niemeyer J.
    • в журнале Journal of Superconductivity (Plenum), том 12, № 6, с. 747-755 DOI
  • 
    • 1999 Multilayer techinque for fabricating Nb junction circuits exhibiting charging effects
    • Pavolotsky A.V., Weimann Th, Scherer H., Krupenin V.A., Niemeyer J., Zorin A.B.
    • в журнале Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, издательство AIP Publishing (United States), том 17, № 1, с. 230-232 DOI
  • 
    • 1999 Novel Method for Fabricating Deep Submicron Nb/AlOx/Nb Tunnel Junctions Based on Spin-on Glass Planarization
    • Pavolotsky A.B., Weimann Th, Scherer H., Niemeyer J., Zorin A.B., Krupenin V.A.
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 9, № 2, с. 3251-3254 DOI
  • 
    • 1998 A New Technology for Metallic Multilayer Single Electron Tunneling Devices
    • Weimann Th, Scherer H., Wolf H., Krupenin V.A., Niemeyer J.
    • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 41, № 42, с. 559-562 DOI
  • 
    • 1998 Coulomb blockade electrometer based on single Cooper pair tunneling
    • Zorin A.B., Pashkin Yu A., Krupenin V.A., Scherer H.
    • в журнале Applied Superconductivity (Elsevier), том 6, № 7-9, с. 453-458 DOI
  • 
    • 1998 Noise in Al single electron transistors of stacked design
    • Krupenin V.A., Presnov D.E., Savvateev M.N., Scherer H., Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 84, № 6, с. 3212-3215 DOI
  • • 1998 Sensing of dynamic charge states using single-electron tunneling transistors
    • Krupenin V.A., Lotkhov S.V., Scherer H., Zorin A.B., Ahlers F.J., Niemeyer J., Wolf H.
    • в журнале Physics Uspekhi, издательство Russian Academy of Sciences (Russian Federation), том 41, с. 204-206 DOI
  • 
    • 1997 Investigation of the offset charge noise in single electron tunneling devices
    • Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B., Krupenin V.A., Lotkhov S.V., Presnov D.E.
    • в журнале IEEE Transactions on Instrumentation and Measurement, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 46, № 2, с. 303-306 DOI
  • 
    • 1997 Metallic single electron devices fabricated using a multilayer technique
    • Weimann T., Wolf H., Scherer H., Krupenin V.A., Niemeyer J.
    • в журнале Applied Physics Letters, издательство AIP Publishing (United States), том 71, с. 713 DOI
  • 
    • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2283-2284 DOI
  • 
    • 1996 Detection of the single electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2281-2282 DOI

• Статьи в сборниках

  • • 2021 Optimizing Agricultural Landscapes: Measures Towards Prosperity and Sustainability
    • Mueller Lothar, Eulenstein Frank, Mirschel Wilfried, Schindler Uwe, Sychev Viktor G., Rukhovich Olga V., Sheudzhen Askhad K., Romanenkov Vladimir, Lukin Sergey M., McKenzie Blair M., Jones Michael, Dannowski Ralf, Blum Winfried E.H, Salnjikov Elmira, Saparov Abdulla, Pachikin Konstantin, Hennings Volker, Scherber Christoph, Hoffmann Jörg, Antrop Marc, Garibaldi Lucas, Gómez Carella Dulce S., Augstburger Horacio, Schwilch Gudrun, Angelstam Per, Manton Michael, Dronin Nikolai M.
    • в сборнике Exploring and Optimizing Agricultural Landscapes, издательство SPRINGER PUBLISHING CO (11 WEST 42ND STREET, NEW YORK, USA, NY,10036), с. 91-130 DOI
  • 
    • 1998 Low noise single electron transistors of stacked design
    • Krupenin V.A., Presnov D.E., Savvateev M.N., Scherer H., Zorin A.B., Niemeyer J.
    • в сборнике CPEM Digest (Conference on Precision Electromagnetic Measurements 6-10 Jul 1998), место издания IEEE Washington, DC, USA, 6-10 July, с. 140-141 DOI
  • 
    • 1996 Investigation of the offset charge noise in single electron tunneling devices
    • Ahlers F.J., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Weimann T., Wolf H., Zorin A.B.
    • в сборнике CPEM (Conference on Precision Electromagnetic Measurements) Digest. Proceedings of the 1996 Conference on Precision Electromagnetic Measurements (17-20 June 1996, Braunschweig, Germany), издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), с. 507-508 DOI

• Тезисы докладов

  • • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
  • • 1996 Detection of the single-electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
  • • 1996 Verification of a memory cell based on a single electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B.
    • в сборнике Abstracts of IX Trilateral German - Russian - Ukrainian Seminar on High-Temperature Superconductivity, место издания Gabelbach Germany, 22-25 September, тезисы, с. 22