Proceedings of SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologiesсборник
Статьи, опубликованные в сборнике
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2003
Reliable determination of wavelength dependence of thin film refractive index
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Tikhonravov A.,
Trubetskov M.,
Amotchkina T.,
Andrei Tikhonravov,
Ristau D.,
Gunster S.
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в сборнике Proceedings of SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, том 5188, тезисы, с. 331-342
DOI