2011 9th East-West Design & Test Symposium (EWDTS)сборник

Статьи, опубликованные в сборнике

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  • 2011 Si BJT and SiGe HBT performance modeling after neutron radiation exposure
  • Petrosyants Konstantin, Vologdin Eric, Smirnov Dmitry, Torgovnikov Rostislav, Kozhukhov Maxim
  • в сборнике 2011 9th East-West Design & Test Symposium (EWDTS), серия Symposium EWDTS, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), с. 267-270 DOI
• • 2011 Simulation-based hardware verification with time-abstract models
  • Kamkin Alexander
  • в сборнике 2011 9th East-West Design & Test Symposium (EWDTS), серия Symposium EWDTS, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States)