ИСТИНА

Pahlke Patrick

Соавторы: Sieger M., van Tendeloo G., Меледин А.А., Eisterer M., Lao M., Holzapfel B., Schultz L., Haenisch J., Hühne R., Ottolinger R., Bianchetti M., Nielsch K., Usoskin A. показать полностью..., Bauer M., Bogorodsky D., Borshevsky V.I., Büldt G., Dencher N.A., Gensch T., Hanisch J., MacManus-Driscoll J.L., Mishin A.V., Opherden L., Sparing M., Stafford B., Stromer J., Горделий В.И., Гущин И.Н., Калёнов С.В., Маслов И.А., Охрименко И.П.

8 статей

Количество цитирований статей в журналах по данным Web of Science: 110, Scopus: 97

IstinaResearcherID (IRID): 39271891

Деятельность

• Статьи в журналах

  • 
    • 2018 Efficient non-cytotoxic fluorescent staining of halophiles
    • Maslov Ivan, Bogorodskiy Andrey, Mishin Alexey, Okhrimenko Ivan, Gushchin Ivan, Kalenov Sergei, Dencher Norbert A., Fahlke Christoph, Büldt Georg, Gordeliy Valentin, Gensch Thomas, Borshchevskiy Valentin
    • в журнале Scientific reports, издательство Nature Publishing Group (United Kingdom), том 8, № 1, с. 1-12 DOI
  • • 2018 Influence of artificial pinning centers on structural and superconducting properties of thick YBCO films on ABAD-YSZ templates
    • Pahlke Patrick, Sieger Max, Ottolinger Rick, Lao Mayraluna, Eisterer Michael, Meledin Alexander, Van Tendeloo Gustaaf, Haenisch Jens, Holzapfel Bernhard, Schultz Ludwig, Nielsch Kornelius, Hühne Ruben
    • в журнале Superconductor Science and Technology, издательство IOP Publishing ([Bristol, UK], England) DOI
  • 
    • 2018 Thick secondary phase pinning-enhanced YBCO films on technical templates
    • Sieger M., Pahlke P., Lao M., Meledin A., Eisterer M., Van Tendeloo G., Schultz L., Nielsch K., Huhne R.
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), с. 1-1 DOI
  • • 2017 Influence of substrate tilt angle on the incorporation of BaHfO3 in thick YBa2Cu3O7-δ films
    • Sieger Max, Pahlke Patrick, Ottolinger Rick, Stafford Benjamin, Lao Mayraluna, Meledin Alexander, Bauer Markus, Eisterer Michael, Van Tendeloo Gustaaf, Schultz Ludwig
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 27, № 4 DOI
  • 
    • 2017 Tailoring microstructure and superconducting properties in thick BaHfO3 and Ba2Y(Nb/Ta)O6 doped YBCO films on technical templates
    • Sieger Max, Pahlke Patrick, Lao Mayraluna, Eisterer Michael, Meledin Alexander, Van Tendeloo Gustaaf, Ottolinger Rick, Haenisch Jens, Holzapfel Bernhard, Usoskin Alexander
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 27, № 4, с. 1-7
  • 
    • 2016 Ba2Y(Nb/Ta)O6 –Doped YBCO Films on Biaxially Textured Ni–5at.% W Substrates
    • Sieger Max, Pahlke Patrick, Hanisch Jens, Sparing Maria, Bianchetti Marco, MacManus-Driscoll Judith, Lao Mayraluna, Eisterer Michael, Meledin Alexander, Van Tendeloo Gustaaf
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 26, № 3, с. 1-5 DOI
  • 
    • 2016 Large pinning forces and matching effects in YBa2Cu3O7-δ thin films with Ba2Y(Nb/Ta)O6 nano-precipitates
    • Opherden Lars, Sieger Max, Pahlke Patrick, Hühne Ruben, Schultz Ludwig, Meledin Alexander, Van Tendeloo Gustaaf, Nast Rainer, Holzapfel Bernhard, Bianchetti Marco
    • в журнале Scientific reports, издательство Nature Publishing Group (United Kingdom), том 6, с. 21188 DOI
  • 
    • 2016 Reduced Jc Anisotropy and Enhanced In-Field Performance of Thick BaHfO3 -Doped YBa2Cu3O7-δ Films on ABAD-YSZ Templates
    • Pahlke Patrick, Lao Mayraluna, Eisterer Michael, Meledin Alexander, Van Tendeloo Gustaaf, Hanisch Jens, Sieger Max, Usoskin Alexander, Stromer Jan, Holzapfel Bernhard
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 26, № 3, с. 1-4 DOI