INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORSсборник
Статьи, опубликованные в сборнике
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2012
New reference material for transmission electron microscope calibration
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Filippov M.N.,
Gavrilenko V.P.,
Kovalchuk M.V.,
Mityukhlyaev V.B.,
Rakov A.V.,
Todua P.A.,
Vasiliev A.L.
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в сборнике INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS, серия VI. PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, том 8466, с. 84660-84660