Lotkhov S.V.
Количество цитирований статей в журналах по данным
Web of Science: 608,
Scopus: 549
IstinaResearcherID (IRID): 543880
Деятельность
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Статьи в журналах
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2006
Ground-state characterization of Nb charge-phase Josephson qubits
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Zangerle H.,
Könemann J.,
Mackrodt B.,
Dolata R.,
Lotkhov S.V.,
Bogoslovsky S.A.,
Götz M.,
Zorin A.B.
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в журнале Physical Review B, издательство American Physical Society (United States), том 73, № 22, с. 224527-1-224527-8
DOI
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2003
Progress in measurements of electron pump by means of a CCC
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Feltin N.,
Devoille L.,
Piquemal F.,
Lotkhov S.V.,
Zorin A.B.
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в журнале IEEE Transactions on Instrumentation and Measurement, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 52, № 4, с. 599-603
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1999
A Superconducting Electrometer Based on the Resitively Shunted Bloch Transistor
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Lotkhov S.V.,
Zangerle H.,
Zorin A.B.,
Weimann Th,
Scherer H.,
Niemeyer J.
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в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 9, с. 3664-3667
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1999
Charging and heating effects in a system of coupled single-electron devices
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Krupenin V.A.,
Lotkhov S.V.,
Scherer H.,
Zorin A.B.,
Weimann Th,
Ahlers F.J.,
Niemeyer J.,
Wolf H.
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в журнале Physical Review B, издательство American Physical Society (United States), том 59, № 16, с. 10778-10784
DOI
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1999
Highly sensitive electrometers based on single Cooper pair tunneling
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Zorin A.B.,
Lotkhov S.V.,
Pashkin Yu A.,
Zangerle H.,
Krupenin V.A.,
Weimann Th,
Scherer H.,
Niemeyer J.
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в журнале Journal of Superconductivity (Plenum), том 12, № 6, с. 747-755
DOI
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1997
Investigation of the offset charge noise in single electron tunneling devices
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Wolf H.,
Ahlers F.J.,
Niemeyer J.,
Scherer H.,
Weimann T.,
Zorin A.B.,
Krupenin V.A.,
Lotkhov S.V.,
Presnov D.E.
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в журнале IEEE Transactions on Instrumentation and Measurement, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 46, № 2, с. 303-306
DOI
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1997
Resistive state anomalies of superconducting nanostructures
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Arutyunov K.Y.,
Krupenin V.A.,
Lotkhov S.V.,
Pavolotski A.B.,
Rinderer L.
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в журнале Superlattices and Microstructures, издательство ELSEVIER SCIENCE BV (PO BOX 211, AMSTERDAM, NETHERLANDS, 1000 AE), том 21, № A, с. 27-30
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1996
Charge state instabilities in the single-electron trap
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Krupenin V.A.,
Lotkhov S.V.,
Presnov D.E.,
Zorin A.B.,
Ahlers F.J.,
Niemeyer J.,
Scherer H.,
Weimann T.,
Wolf H.
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в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2283-2284
DOI
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1996
Detection of the single electron tunneling noise using Coulomb blockade electrometer
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Zorin A.B.,
Krupenin V.A.,
Lotkhov S.V.,
Niemeyer J.,
Presnov D.E.,
Scherer H.,
Wolf H.,
Ahlers F.J.,
Weimann T.
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в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2281-2282
DOI
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Статьи в сборниках
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1996
Investigation of the offset charge noise in single electron tunneling devices
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Ahlers F.J.,
Krupenin V.A.,
Lotkhov S.V.,
Niemeyer J.,
Presnov D.E.,
Scherer H.,
Weimann T.,
Wolf H.,
Zorin A.B.
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в сборнике CPEM (Conference on Precision Electromagnetic Measurements) Digest. Proceedings of the 1996 Conference on Precision Electromagnetic Measurements (17-20 June 1996, Braunschweig, Germany), издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), с. 507-508
DOI
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Доклады на конференциях
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2014
Noise properties of SET transistor made from highly doped SOI
(Устный)
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Авторы:
Presnov D.E.,
Amitonov S.V.,
Krupenin V.A.,
Lotkhov S.V.,
Zorin A.B.,
Rudakov V.I.
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International Conference “Micro- and Nanoelectronics – 2014” (ICMNE-2014), “Ershovo” resort, Zvenigorod, Moscow Region, Russia, Россия, 2014
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Тезисы докладов
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2014
Noise properties of SET transistor made from highly doped SOI
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Presnov D.E.,
Amitonov S.V.,
Rudakov V.I.,
Lotkhov S.V.,
Zorin A.B.,
Krupenin V.A.
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в сборнике Intenational Conference "Micro- and Nanoelectronics - 2014", ICMNE 2014, October 6-10, “Ershovo” resort, Moscow - Zvenigorod, Russia, Book of Abstracts,, место издания Institute of Physics and Technology of the RAS,, тезисы, с. O1-23
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1996
Charge state instabilities in the single-electron trap
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Krupenin V.A.,
Lotkhov S.V.,
Presnov D.E.,
Zorin A.B.,
Ahlers F.J.,
Niemeyer J.,
Scherer H.,
Weimann T.,
Wolf H.
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в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
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1996
Detection of the single-electron tunneling noise using Coulomb blockade electrometer
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Zorin A.B.,
Krupenin V.A.,
Lotkhov S.V.,
Niemeyer J.,
Presnov D.E.,
Scherer H.,
Wolf H.,
Ahlers F.J.,
Weimann T.
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в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
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1996
Verification of a memory cell based on a single electron trap
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Krupenin V.A.,
Lotkhov S.V.,
Presnov D.E.,
Wolf H.,
Ahlers F.J.,
Niemeyer J.,
Scherer H.,
Weimann T.,
Zorin A.B.
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в сборнике Abstracts of IX Trilateral German - Russian - Ukrainian Seminar on High-Temperature Superconductivity, место издания Gabelbach Germany, 22-25 September, тезисы, с. 22
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